Wetting property and surface characterization of silicon wafer

Project undertaken by: Faculty of Engineering, Chulalongkorn University

Partner: Western Digital (Thailand) Co., LTD.

About research: From Hydrogenated DLC layer for higher resistivity study. It is known that the surface energy can be used to specify the stability of a DLC layer, but the methods to measure the surface energy that are currently in use are not very precise. Therefore, the baseline of surface energy measurement is needed to be constructed.

• Facebook
• Twitter
• Line